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[1] S.G. Seo, J. Jeong, S.Y. Kim, S. Kim, K. Kim, K. Kim, S.H. Jin*, "Bias Stress Instability in Multilayered MoTe2 Field Effect Transistors under DC and Pulse-mode Operation", Electronic Letters 57, 193 (2021) [IF: 1.316]

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[2] R.K. Mishra, D. Mishra, M. Krishnaiah, S.Y. Kim, S.H. Jin*, "Self-discharge and Voltage-holding in Symmetric Supercapacitors for Energy Storage Based on Branch-like MoS2 Nanomaterial Electrodes", Ceramics International 47, 11231 (2021) [IF: 3.830, JCR < 10%]

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Incheon National University, Engineering building E8, room # 453

119 Academy-ro, Yeonsu-gu, Inchoen, 406-772, Korea

TEL : +82-32-835-8865, E-mail : shjin@inu.ac.kr

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