[1] J.H. Ryu , G.W. Baek, G.T. Yu,  H.W. Kim, S.H. Jin*, “Multiple Annealing Temperature Dependency on Reliability of Multilayer MoS2 Field Effect Transistors”, Korean Conference on Semicondouctors 2016 (KCS 2016), February 22-24, 2016

 

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[2] G.W. Baek, Y.G. Hong, I.J. Yim,  H.W. Kim, Y.B. Lee, , J.H. Ryu, G.T. Yu, S.H. Jin*, “Dielectrophoretic Density control for Unpurified Solution-Processed Single Walled Carbon Nanotubes and its high performance with Purification”, Korean Conference on Semicondouctors 2016 (KCS 2016), February 22-24, 2016